Thomas W. Williams

Thomas W. Williams (born August 3, 1943) was an American engineer, Chief Scientist and fellow at Synopsys. He is known for his contributions to electronic design, automation and testing of electronic systems.

Education and career Williams obtained a bachelor's degree in electrical engineering from Clarkson University, a master's degree in pure mathematics from the State University of New York at Binghamton, and a Ph.D. in electrical engineering from Colorado State University. “for developing the level-sensitive scan technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.”

In 2007, Williams received the European Design and Automation Association (EDAA) Lifetime Achievement Award for outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems. This award was presented during the opening session of the Design Automation and Test in Europe conference.

In 2010, Williams was the recipient of the IEEE Test Technology Technical Council Lifetime Contribution Medal.

In 2018, the Electronic System Design Alliance honored Williams with the Phil Kaufman Award "for his outstanding contributions to test automation and his overall impact on the electronics industry".